|
KMID : 1004520110270030285
|
|
Journal of Dental Rehabilitation and Applied Science
2011 Volume.27 No. 3 p.285 ~ p.292
|
|
|
Morphological Analysis of the Sinus Lateral Wall using Computed Tomography
|
|
Kim Yong-Gun
|
|
|
Abstract
|
|
|
|
The purpose of thise study was to measure the thickness of the sinus lateral wall using computed tomography (CT), and to find the most suitable vertical position for lateral window opening prior to sinus elevation. Thirty patients requiring sinus elevation had CT images taken with Philips Brilliance iCT. The thickness of the sinus lateral wall was measured according to its vertical position against the sinus inferior border, and its mean was calculated through three repeated measurements. When measured 2 mm above the sinus inferior border (SIB+2), the thickness of the sinus lateral wall was observed to be more than 2 mm. When measured 3 mm above the sinus inferior border (SIB +3), the sinus lateral wall was less than 2 mm in thickness. It is recommended that the lateral wall window be made 3 mm above the sinus inferior border when performing sinus elevation using the lateral approach.
|
|
|
KEYWORD
|
|
|
Computed tomography, sinus inferior border, lateral wall thickness
|
|
|
FullTexts / Linksout information
|
|
|
|
|
Listed journal information
|
|
|